High-resolution Backscattering Spectrometer

X-ray emission spectrometer, Right: X-ray emission spectrum of Mn K_beta, measured by 9 crystal analyzer Si<440> array, in 1m bended radius

This high-resolution backscattering spectrometer with multiple analyzers is used for fluorescence analysis and inelastic x-ray scattering. The low cross-section in inelastic x-ray scattering requires a large solid angle covered with analyzers to obtain an acceptable signal. The energy resolution of this type of spectrometer is of the order of 0.1eV - 1eV, depending on the type of analyzer crystal and scattering angle.

In resonant inelastic x-ray scattering experiments, the emission lines of the sample are measured with high energy-resolution while the incident energy is tuned through the absorption edge. This method allows separation of different features in the near-edge region which are not observable with conventional near-edge spectroscopy due to the life-time broadening.

In non-resonant inelastic x-ray scattering experiments, the energy of the spectrometer is fixed and the incident energy is tuned, so that the energy difference corresponds to the energy of electronic transitions like absorption edges or band-transitions. This method allows investigation of electronic transitions in the UV and soft x-ray range with hard x-rays. The advantage is that the sample can be mounted in a non-UHV environments like high-pressure diamond anvil cells and in reaction-chambers.

Publication 8th International Conference on Synchrotron Radiation Instrumentation (SRI) meeting in SanFransisco, August 25th 2003, California, Multi-Element Analyzer for Inelastic X-ray Scattering